The aim of this project is to develop a microwave materials characterization technique that combines measurements from a multi-static array of antennas with synthetic aperture radar (SAR) imaging techniques. The proposed technique will allow for characterizing localized areas of an arbitrarily shaped sample under test (SUT), and it will rely on SAR algorithms to focus the measurements on the SUT, followed by a model-based inverse iterative solver to calculate material properties. The primary goal of this project is to address critical issues related to this technique, especially calibration and modeling.
