X-ray Radiography and Tomography NDE
X-ray Radiography
- Low energy X-ray imaging for historical paper watermarks
- Quality control for PCB and IC chips in cryogenic environment
- Field inspection for joints of gas plastic pipelines (HDPE and MDPE)
High Resolution Computed Tomography
- Iterative reconstruction algorithms for limited angle scan and reduce artifacts
- Digital metrology and defect characterization for industrial applications
- Data fusion using multi-modal NDE technologies with THz and UT
Materials Characterization
- High energy X-ray diffraction (HEXRD) analysis for residual stress
- Diffraction contrast tomography (DCT) for crystallography in 3D grains
New Modality of X-ray Imaging
- X-ray phase contrast imaging and tomography
- Dual-energy and spectral computed tomography (CT)
Zhan Zhang
Associate Scientist
275 Applied Sciences Complex 2
zhan@iastate.edu
Expertise
- X-ray imaging NDE
Digital Radiography and Computed Tomography - CT iterative reconstruction methods
- X-ray imaging simulation and modeling
- High energy X-ray diffraction analysis
Keywords
- X-ray Imaging, Computed Tomography, Materials Characterization, High Resolution
Synergistic Activities
- Iowa section chair, American Society for Nondestructive Testing (ASNT)
- E07 Committee member, American Society for Testing and Materials (ASTM)
- Active Reviewer for Journal of Nondestructive Evaluation, and ASME Journal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems