Al Qaseer, Mohammad Tayeb

Microwave & Millimeter Wave Nondestructive Evaluation (NDE)

Real-Time, High-Resolution Imaging System Development

  • Real-Time, 3D, high-resolution & portable imaging arrays
  • Development of compact millimeter wave imaging systems
  • AI & ML for microwave and millimeter-wave imaging

Materials Characterization

  • Resonant methods for characterization of low-loss materials
  • Accurate evaluation of complex dielectric, magnetic & thickness properties of complex structures
  • Evaluation of chemical & physical properties of materials used in civil, transportation, space & aerospace environments
  • Conductivity (Resistivity) measurements of thin sheets
  • Cure-state monitoring & evaluation of material degradation

Nonlinear and High Power Techniques

  • Inspection of electronics and passive materials using harmonic generation

Millimeter Wave Evaluation for Additive Manufacturing

  • Characterization of metal powder
  • Detection of voids, flaws, and moisture in polymeric filaments

Mohammad Tayeb Al Qaseer

Associate Professor, Electrical and Computer Engineering, (515) 294-0089
alqaseer@iastate.edu

Funded Research Sponsors

  • Air Force, Army, Navy, NASA, NSF, DOE, USDoT, including SBIR & STTR Phase I & II
  • Boeing, Honeywell, Pratt & Whitney, EPRI, Michelin, FSE, GE, GM, & others

Keywords

  • 3D Imaging; Materials Characterization; Inspection of AM raw materials

Recognitions, Awards & Patents

  • Senior Member, Institute of Electrical & Electronic Engineers (IEEE)
  • Fellow, American Society for Nondestructive Testing (ASNT)
  • IEEE J. Barry Oakes Advancement Award, IEEE I&M Society Outstanding Young Engineer Award.
  • ASNT Research Award for Innovation.
  • Thirteen issued US and international patents.

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