Bridging Materials Science and Nondestructive Evaluation (NDE)

Peter C CollinsPeter Collins profile pic

Professor
CSDM and CANFSA Director
Stanley Chair of Interdisciplinary Engineering
pcollins@iastate.edu
(515) 294-5127

Academic Department Profile

Materials characterization across length scales and dimensionality

  • Uniquely capable of conducting orientation microscopy in 2D and 3D from cubic nanometers to cubic centimeters
  • Evaluation of all aspects of materials state (phases, composition, defects, texture) for materials in transportation, aerospace, space, defense, and energy systems

Evaluation of Additively Manufactured Components

  • Accurate quantitative characterization of materials state for all metals-based additive manufacturing techniques, from powder bed through electron beam or laser wire fed to additive friction stir deposition.

Spatially Resolved Acoustic Spectroscopy

  • Designed and built SRAS system integrated into a 3D serially sectioning microscope system.
  • Application space includes, importantly, the study of microtextured regions in titanium alloys.

Establishment of first-ever feasibility diagrams for materials and NDE modalities

  • Designed to provide insights into whether particular NDE modalities will produce signals that can be determined for compositionally or microstructurally graded structures.

 

Funded Research Sponsors

  • NSF, DoD (Army, ONR, Air Force, DARPA), DoE
  • Boeing, Honeywell, Lockheed Martin, GE, others

Key Academic Research Partners

  • Univ. of Illinois, Penn State, Univ. of North Texas, Carnegie Mellon, Colorado School of Mines, Univ. of Nottingham, Imperial College, UNSW

Recognitions, Awards, Papers & Patents

  • Fellow, Alpha Sigma Mu (FΑΣΜ)
  • ASM: Henry Marion Howe Medal
  • AIME/TMS: Champion H. Mathewson Award
  • 14th Edition “DeGarmo’s materials and processes in manufacturing”
  • Eighty peer-reviewed publications, 3 US patents

 

Keywords

  • Imaging; Materials Characterization; Additive Manufacturing; Materials modeling; SRAS

 

Top left - Materials in AM enviroments Top right - Orientation and defect microscopy across scales Middle right - NDE Feasibility Middle left - MURI Bottom right - Novel gradient materials