XRSIM is an x-ray simulator.  It was primarily developed by J. Gray, J.Xu, S. Wendt, T. Jensen, and F. Inanc.


XRSIM was developed in order to:

  • Determine Minimum Detectable Flaw Sizes
  • Assist in calculating assessment of Inspection Sensitivity versus Cost
  • Aid in Determination of Optimal Inspection Coverage
  • Assess Flaw Characteristics and Effects
  • Educate and Train the NDE Community
  • Aid with Concurrent Engineering
  • Prototype Medical Applications