Objectives:

• Improve fundamental understanding of anisotropy on radiography capabilities (Ti, Ni, and other alloys)
  

• Incorporate anisotropic scattering into
  models and utilize results to improve detection/characterization of casting defect
  
  
• Implement results in cooperation with industrial partners including techniques to minimize effect of diffraction mottling from grain diffraction on images
  

Approach:

• Measure basic radiographic properties and correlate with microstructure and grain orientation
  
  
• Determine relationship between diffraction, grain orientation, shape, and size on film response
  
  
• Use energy sensitive x-ray characterization procedures to determine spectra that contributes to mottling
  
  
• Determine filtering and image processing approaches to improve detectability without significant loss in contrast sensitivity
  
  
• Implement improved processes with industry partners
  

Products:

• Grain diffraction models validated to insure they accurately represent real grain diffraction effects for classes of applications
  
  
• Tool implemented in PC version of XRSIM for use by industry in inspection design

Links:

• Radiographic Inspection